Povej prijatelju o tem izdelku:
Electrical Atomic Force Microscopy for Nanoelectronics 1st ed. 2019 edition
Cena
€ 171,49
Naročeno iz oddaljenega skladišča
Predvidena dobava 4. - 12. jun
Kaj pravijo naše stranke:
Dodaj na svoj seznam želja iMusic
Electrical Atomic Force Microscopy for Nanoelectronics
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.
408 pages, 60 Tables, color; 230 Illustrations, color; 26 Illustrations, black and white; XX, 408 p.
| Medij | Knjige Book |
| Izdano | 24. avgusta 2019 |
| ISBN13 | 9783030156114 |
| Založniki | Springer Nature Switzerland AG |
| Strani | 408 |
| Dimenzije | 150 × 220 × 20 mm · 805 g |
| Jezik | Nemščina |
| Urednik | Celano, Umberto |