Izdaja: Meyer, J. Patrick (University of Virginia, USA)

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Cover for Meyer, J. Patrick (University of Virginia, USA) · Applied Measurement with jMetrik (Hardcover Book) (2014)

Applied Measurement with jMetrik (2014)

Meyer, J. Patrick (University of...

Cover for Meyer, J. Patrick (University of Virginia, USA) · Applied Measurement with jMetrik (Paperback Book) (2014)

Applied Measurement with jMetrik (2014)

Meyer, J. Patrick (University of...