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Advances in Imaging and Electron Physics
Peter Hawkes
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
380 pages
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 23. maja 2013 |
| ISBN13 | 9780124077027 |
| Založniki | Elsevier Science Publishing Co Inc |
| Strani | 380 |
| Dimenzije | 151 × 229 × 27 mm · 771 g |
| Urednik serije | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
