Reliability and Failure of Electronic Materials and Devices - Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) - Books - Elsevier Science Publishing Co Inc - 9780125249850 - June 1, 1998
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Reliability and Failure of Electronic Materials and Devices

Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

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Reliability and Failure of Electronic Materials and Devices

Suitable as a reference work for reliability professionals or as a text for graduate students, this book introduces reliability literature of microelectronic and electronic-optional devices. It integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation.

692 pages, b&w illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 1, 1998
ISBN13 9780125249850
Publishers Elsevier Science Publishing Co Inc
Pages 720
Dimensions 151 × 229 × 37 mm   ·   1.10 kg
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