Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Patrick Echlin - Knjige - Springer Science+Business Media - 9780306421402 - 31. marca 1986
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis 1986 edition


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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.


454 pages, biography

Medij Knjige     Hardcover Book   (Knjiga s trdim hrbtom in platnicami)
Izdano 31. marca 1986
ISBN13 9780306421402
Založniki Springer Science+Business Media
Strani 454
Dimenzije 156 × 234 × 27 mm   ·   721 g
Jezik Angleščina  

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