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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin Softcover reprint of the original 1st ed. 1986 edition
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
466 pages, 357 black & white illustrations, 7 colour illustrations, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 8. junija 2013 |
| ISBN13 | 9781475790290 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 454 |
| Dimenzije | 152 × 229 × 24 mm · 630 g |
| Jezik | Angleščina |
Več od Patrick Echlin
Prikaži vseOgled vseh Patrick Echlin ( Na primer Hardcover Book in Paperback Book )