Povej prijatelju o tem izdelku:
Principles of Analytical Electron Microscopy Goldstein Joseph 1986 edition
Principles of Analytical Electron Microscopy
Goldstein Joseph
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
448 pages, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 31. julija 1986 |
| ISBN13 | 9780306423871 |
| Založniki | Springer Science+Business Media |
| Strani | 448 |
| Dimenzije | 156 × 234 × 26 mm · 830 g |
| Jezik | Angleščina |
| Urednik | Goldstein, Joseph |
| Urednik | Joy, David C. |
| Urednik | Romig Jr., Alton D. |
Božična darila lahko vrnete do 31. januarja