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Atom Probe Tomography: Analysis at the Atomic Level Michael K. Miller 2000 edition
Atom Probe Tomography: Analysis at the Atomic Level
Michael K. Miller
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution.
239 pages, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 31. julija 2000 |
| ISBN13 | 9780306464157 |
| Založniki | Springer Science+Business Media |
| Strani | 239 |
| Dimenzije | 170 × 244 × 20 mm · 544 g |
| Jezik | Angleščina |