Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Joseph Goldstein - Knjige - Springer Science+Business Media - 9780306472923 - 31. januarja 2003
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Third Edition 2003 edition


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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.


709 pages, biography

Medij Knjige     Hardcover Book   (Knjiga s trdim hrbtom in platnicami)
Izdano 31. januarja 2003
ISBN13 9780306472923
Založniki Springer Science+Business Media
Strani 689
Dimenzije 178 × 255 × 38 mm   ·   1,68 kg

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