Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications -  - Knjige - Taylor & Francis Ltd - 9780367197360 - 21. decembra 2020
Če se naslovnica in naslov ne ujemata, je naslov pravilen

Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications 1. izdaja

Cena
€ 186,99

Naročeno iz oddaljenega skladišča

Predvidena dobava 24. avg - 7. sep
Dodaj na svoj seznam želja iMusic

Not rated yet

Na voljo tudi kot:

This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials.


184 pages, 7 Tables, black and white; 25 Illustrations, color; 81 Illustrations, black and white

Medij Knjige     Hardcover Book   (Knjiga s trdim hrbtom in platnicami)
Izdano 21. decembra 2020
ISBN13 9780367197360
Založniki Taylor & Francis Ltd
Strani 150
Dimenzije 241 × 159 × 17 mm   ·   406 g
Jezik Angleščina  
Urednik Bruma, Alina (University of Maryland College Park)

Več od istega **izdajatelja**