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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach Pradeep Lall 1. izdaja
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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
Pradeep Lall
This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.
336 pages
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 19. junija 2019 |
| ISBN13 | 9780367400972 |
| Založniki | Taylor & Francis Ltd |
| Strani | 336 |
| Dimenzije | 150 × 220 × 10 mm · 453 g |
| Jezik | Angleščina |
