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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation 1. izdaja
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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation
Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the
368 pages
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 30. junija 2020 |
| ISBN13 | 9780367446802 |
| Založniki | Taylor & Francis Ltd |
| Strani | 368 |
| Dimenzije | 150 × 220 × 10 mm · 680 g |
| Jezik | Angleščina |
| Urednik | Fitzpatrick, M.E. |
| Urednik | Lodini, Alain |
