Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science - Lawrence C Wagner - Books - Chapman and Hall - 9780412145612 - January 31, 1999
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Lawrence C Wagner
Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 1999 edition

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

255 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 31, 1999
ISBN13 9780412145612
Publishers Chapman and Hall
Pages 255
Dimensions 155 × 235 × 17 mm   ·   589 g
Language English  
Editor Wagner, Lawrence C.

See all of Lawrence C Wagner ( e.g. Hardcover Book and Paperback Book )