Digital Integrated Circuit Testing from a Quality Perspective - Eugene R. Hnatek - Books - Kluwer Academic Publishers Group - 9780442006433 - August 31, 1993
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Digital Integrated Circuit Testing from a Quality Perspective 1993 edition

Eugene R. Hnatek

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Digital Integrated Circuit Testing from a Quality Perspective 1993 edition

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

180 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 31, 1993
ISBN13 9780442006433
Publishers Kluwer Academic Publishers Group
Pages 180
Dimensions 156 × 234 × 12 mm   ·   476 g
Language English  
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