Reflection Electron Microscopy and Spectroscopy for Surface Analysis - Wang, Zhong Lin (Georgia Institute of Technology) - Books - Cambridge University Press - 9780521017954 - August 22, 2005
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Wang, Zhong Lin (Georgia Institute of Technology)

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.

460 pages, 224 b/w illus. 10 tables

Media Books     Paperback Book   (Book with soft cover and glued back)
Released August 22, 2005
ISBN13 9780521017954
Publishers Cambridge University Press
Pages 460
Dimensions 170 × 244 × 25 mm   ·   731 g

See all of Wang, Zhong Lin (Georgia Institute of Technology) ( e.g. Paperback Book and Hardcover Book )