Povej prijatelju o tem izdelku:
Characterization of High Tc Materials and Devices by Electron Microscopy Nigel D Browning
Cena
€ 61,99
Naročeno iz oddaljenega skladišča
Predvidena dobava 13. - 27. nov
Božična darila lahko vrnete do 31. januarja
Prejemajte obvestila o novih izdajah izvajalca Nigel D Browning
Kaj pravijo naše stranke:
Dodaj na svoj seznam želja iMusic
Na voljo tudi kot:
Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
408 pages, 267 b/w illus. 3 tables
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 23. novembra 2006 |
| ISBN13 | 9780521031707 |
| Založniki | Cambridge University Press |
| Strani | 408 |
| Dimenzije | 168 × 243 × 21 mm · 669 g |
| Jezik | Angleščina |
| Urednik | Browning, Nigel D. (University of Illinois, Chicago) |
| Urednik | Pennycook, Stephen J. (Oak Ridge National Laboratory, Tennessee) |
