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Focused Ion Beam Systems: Basics and Applications Nan Yao
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Focused Ion Beam Systems: Basics and Applications
Nan Yao
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
408 pages, black & white illustrations
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 14. aprila 2011 |
| ISBN13 | 9780521158596 |
| Založniki | Cambridge University Press |
| Strani | 408 |
| Dimenzije | 169 × 246 × 24 mm · 668 g |
| Jezik | Angleščina |
| Urednik | Yao, Nan (Princeton University, New Jersey) |
