Thin Film Materials: Stress, Defect Formation and Surface Evolution - Freund, L. B. (Brown University, Rhode Island) - Knjige - Cambridge University Press - 9780521529778 - 11. decembra 2008
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Thin Film Materials: Stress, Defect Formation and Surface Evolution

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Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. Describing fundamental concepts with practical case studies, highly illustrated, thorough referencing and containing numerous homework problems, this book will be essential for graduate courses on thin films and the classic reference for researchers.


770 pages, 75 b/w illus. 75 exercises

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 11. decembra 2008
ISBN13 9780521529778
Založniki Cambridge University Press
Strani 770
Dimenzije 175 × 247 × 35 mm   ·   1,38 kg
Jezik Angleščina  

Več od Freund, L. B. (Brown University, Rhode Island)

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