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Characterization of High Tc Materials and Devices by Electron Microscopy Nigel D Browning
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Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
406 pages, 267 b/w illus. 3 tables
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 6. julija 2000 |
| ISBN13 | 9780521554909 |
| Založniki | Cambridge University Press |
| Strani | 406 |
| Dimenzije | 251 × 177 × 32 mm · 864 g |
| Jezik | Angleščina |
| Urednik | Browning, Nigel D. (University of Illinois, Chicago) |
| Urednik | Pennycook, Stephen J. (Oak Ridge National Laboratory, Tennessee) |
