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Semiconductor Memories: Technology, Testing, and Reliability Ashok K. Sharma
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Semiconductor Memories: Technology, Testing, and Reliability
Ashok K. Sharma
Provides in depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods, including: memory cell structures and fabrication technologies; application specific memories and architectures; and memory design, fault modeling and test algorithms, limitations, and trade offs.
480 pages, illustrations
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 26. avgusta 2002 |
| ISBN13 | 9780780310001 |
| Založniki | John Wiley & Sons Inc |
| Strani | 480 |
| Dimenzije | 183 × 257 × 33 mm · 1,06 kg |
