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High Resolution X-Ray Diffractometry And Topography D.K. Bowen 1. izdaja
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High Resolution X-Ray Diffractometry And Topography
D.K. Bowen
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.
264 pages, black & white illustrations
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 5. februarja 1998 |
| ISBN13 | 9780850667585 |
| Založniki | Taylor & Francis Ltd |
| Strani | 262 |
| Dimenzije | 178 × 263 × 20 mm · 656 g |
| Jezik | Angleščina |
