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Microelectronic Reliability: Integrity a Emiliano Pollino
Microelectronic Reliability: Integrity a
Emiliano Pollino
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
556 pages, 1, black & white illustrations
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 1. aprila 1989 |
| ISBN13 | 9780890063507 |
| Založniki | Artech House Publishers |
| Strani | 556 |
| Dimenzije | 161 × 235 × 41 mm · 1,09 kg |
| Urednik | Pollino, Emiliano |