Povej prijatelju o tem izdelku:
Yield and Reliability in Microwave Circu Michael D. Meehan
Yield and Reliability in Microwave Circu
Michael D. Meehan
A reference for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems.
300 pages, 1, black & white illustrations
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 1. decembra 1993 |
| ISBN13 | 9780890065273 |
| Založniki | Artech House Publishers |
| Strani | 300 |
| Dimenzije | 152 × 229 × 20 mm · 585 g |
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