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Yield and Reliability in Microwave Circu
Michael D. Meehan
Yield and Reliability in Microwave Circu
Michael D. Meehan
A reference for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems.
300 pages, 1, black & white illustrations
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | December 1, 1993 |
ISBN13 | 9780890065273 |
Publishers | Artech House Publishers |
Pages | 300 |
Dimensions | 152 × 229 × 20 mm · 585 g |
See all of Michael D. Meehan ( e.g. Hardcover Book )