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Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings
Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
514 pages, black & white illustrations
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 5. junija 2014 |
| ISBN13 | 9781107409484 |
| Založniki | Cambridge University Press |
| Strani | 514 |
| Dimenzije | 152 × 229 × 26 mm · 812 g (Teža (ocenjena)) |
| Jezik | Angleščina |
| Urednik | Filter, William F. |
| Urednik | Frost, Harold J. (Dartmouth College, New Hampshire) |
| Urednik | Ho, Paul S. (University of Texas, Austin) |
| Urednik | Rodbell, Kenneth P. (IBM T J Watson Research Center, New York) |