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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
Adam Foster
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
282 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 23. novembra 2010 |
| ISBN13 | 9781441923066 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 282 |
| Dimenzije | 155 × 235 × 16 mm · 417 g |
| Jezik | Angleščina |
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