Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization - Alvin W Czanderna - Knjige - Springer-Verlag New York Inc. - 9781441932990 - 6. decembra 2010
Če se naslovnica in naslov ne ujemata, je naslov pravilen

Alvin W Czanderna
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 1st ed. Softcover of orig. ed. 1999 edition

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The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

449 pages, 70 black & white illustrations, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 6. decembra 2010
ISBN13 9781441932990
Založniki Springer-Verlag New York Inc.
Strani 430
Dimenzije 152 × 229 × 23 mm   ·   625 g
Jezik Angleščina  
Urednik Czanderna, Alvin W.
Urednik Madey, Theodore E.
Urednik Powell, Cedric J.

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