Povej prijatelju o tem izdelku:
Yield Simulation for Integrated Circuits - the Springer International Series in Engineering and Computer Science D.m.h. Walker 1st Ed. Softcover of Orig. Ed. 1987 edition
Yield Simulation for Integrated Circuits - the Springer International Series in Engineering and Computer Science
D.m.h. Walker
209 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 10. decembra 2010 |
| ISBN13 | 9781441952011 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 209 |
| Dimenzije | 155 × 235 × 12 mm · 317 g |
| Jezik | Angleščina |