Povej prijatelju o tem izdelku:
Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Hisham Haddara Softcover reprint of the original 1st ed. 1995 edition
Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science
Hisham Haddara
The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.
232 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 26. septembra 2011 |
| ISBN13 | 9781461285847 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 232 |
| Dimenzije | 155 × 235 × 13 mm · 358 g |
| Jezik | Angleščina |
| Urednik | Haddara, Hisham |
Božična darila lahko vrnete do 31. januarja