Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science - Hisham Haddara - Knjige - Springer-Verlag New York Inc. - 9781461285847 - 26. septembra 2011
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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1995 edition

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The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.


232 pages, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 26. septembra 2011
ISBN13 9781461285847
Založniki Springer-Verlag New York Inc.
Strani 232
Dimenzije 155 × 235 × 13 mm   ·   358 g
Jezik Angleščina  
Urednik Haddara, Hisham

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