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Quantitative X-Ray Diffractometry Lev S. Zevin Softcover reprint of the original 1st ed. 1995 edition
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Quantitative X-Ray Diffractometry
Lev S. Zevin
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases.
398 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 27. decembra 2011 |
| ISBN13 | 9781461395379 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 372 |
| Dimenzije | 170 × 244 × 20 mm · 630 g |
| Jezik | Angleščina |
| Urednik | Mureinik, Inez |
Ogled vseh Lev S. Zevin ( Na primer Paperback Book )