Advances in X-Ray Analysis: Volume 33 - - Knjige - Springer-Verlag New York Inc. - 9781461399988 - 2. junija 2012
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Advances in X-Ray Analysis: Volume 33 Softcover reprint of the original 1st ed. 1990 edition

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The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.

724 pages, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 2. junija 2012
ISBN13 9781461399988
Založniki Springer-Verlag New York Inc.
Strani 704
Dimenzije 150 × 220 × 10 mm   ·   1,14 kg
Jezik Angleščina  
Urednik Barrett, Charles S.
Urednik Gilfrich, John V.
Urednik Huang, Ting C.
Urednik Jenkins, Ron

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