Povej prijatelju o tem izdelku:
Ion Beam Surface Layer Analysis: Volume 2 Otto Meyer Softcover reprint of the original 1st ed. 1976 edition
Ion Beam Surface Layer Analysis: Volume 2
Otto Meyer
The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications.
508 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 30. januarja 2012 |
| ISBN13 | 9781461588818 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 491 |
| Dimenzije | 178 × 254 × 26 mm · 879 g |
| Jezik | Angleščina |
| Urednik | Meyer, Otto |
Več od Otto Meyer
Prikaži vseMere med samme udgiver
Več od te serije
Ogled vseh Otto Meyer ( Na primer Hardcover Book , Paperback Book in DVD )