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Electrothermal Analysis of VLSI Systems Yi-Kan Cheng Softcover reprint of the original 1st ed. 2000 edition
Electrothermal Analysis of VLSI Systems
Yi-Kan Cheng
This useful book addresses electrothermal problems in modern VLSI systems. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
210 pages, 36 black & white illustrations
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 20. aprila 2013 |
| ISBN13 | 9781475773736 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 210 |
| Dimenzije | 155 × 235 × 13 mm · 340 g |
| Jezik | Angleščina |