Electron Microdiffraction - J.M. Zuo - Knjige - Springer-Verlag New York Inc. - 9781489923554 - 31. maja 2013
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Electron Microdiffraction Softcover reprint of the original 1st ed. 1992 edition

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Much of this book was written during a sabbatical visit by J. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R.


382 pages, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 31. maja 2013
ISBN13 9781489923554
Založniki Springer-Verlag New York Inc.
Strani 358
Dimenzije 155 × 235 × 20 mm   ·   539 g
Jezik Angleščina