Povej prijatelju o tem izdelku:
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield Mohamed Abu Rahma 2013 edition
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Mohamed Abu Rahma
This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
172 pages, 5 black & white tables, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 15. oktobra 2014 |
| ISBN13 | 9781493902200 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 172 |
| Dimenzije | 155 × 235 × 10 mm · 272 g |
| Jezik | Angleščina |
Božična darila lahko vrnete do 31. januarja