Povej prijatelju o tem izdelku:
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings M Gall
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings
M Gall
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
189 pages, illustrations
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 18. novembra 2009 |
| ISBN13 | 9781605111292 |
| Založniki | Materials Research Society |
| Strani | 204 |
| Dimenzije | 160 × 235 × 15 mm · 400 g |
| Jezik | Angleščina |
| Urednik | Gall, Martin |
| Urednik | Grill, Alfred (IBM T J Watson Research Center, New York) |
| Urednik | Koike, Junichi (Tohoku University, Japan) |
| Urednik | Lacopi, Francesca |
| Urednik | Usui, Takamasa |
Božična darila lahko vrnete do 31. januarja