Povej prijatelju o tem izdelku:
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization - Materials Characterization and Analysis Collection Harland G. Tompkins
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization - Materials Characterization and Analysis Collection
Harland G. Tompkins
178 pages
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 16. decembra 2015 |
| ISBN13 | 9781606507278 |
| Založniki | Momentum Press |
| Strani | 178 |
| Dimenzije | 150 × 220 × 10 mm · 267 g |
| Jezik | Angleščina |
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