Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) - Raimund Ubar - Books - IGI Global - 9781609602123 - March 31, 2011
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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1st edition

Raimund Ubar

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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1st edition

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.

Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 31, 2011
ISBN13 9781609602123
Publishers IGI Global
Pages 578
Dimensions 218 × 284 × 36 mm   ·   1.61 kg
Language English  
Contributor Heinrich Theodor Vierhaus
Contributor Jaan Raik
Contributor Raimund Ubar

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