An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics - Sarah Fearn - Books - Morgan & Claypool Publishers - 9781681740249 - October 16, 2015
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics

Sarah Fearn

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

66 pages, colour illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 16, 2015
ISBN13 9781681740249
Publishers Morgan & Claypool Publishers
Pages 66
Dimensions 177 × 256 × 8 mm   ·   181 g
Language English  

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