Nanometrology Using Transmission Electron Microscopy - Vlad Stolojan - Books - Morgan & Claypool Publishers - 9781681740560 - October 12, 2015
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Nanometrology Using Transmission Electron Microscopy

Vlad Stolojan

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zł 308.90

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Nanometrology Using Transmission Electron Microscopy

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

85 pages, colour illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 12, 2015
ISBN13 9781681740560
Publishers Morgan & Claypool Publishers
Pages 85
Dimensions 178 × 256 × 10 mm   ·   136 g
Language English  
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