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Quantum Metrology with Photoelectrons, Volume I: Foundations
Paul Hockett
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Quantum Metrology with Photoelectrons, Volume I: Foundations
Paul Hockett
The increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. This volume discusses the fundamental concepts along with recent and emerging applications.
165 pages
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | April 20, 2018 |
| ISBN13 | 9781681746852 |
| Publishers | Morgan & Claypool Publishers |
| Pages | 165 |
| Dimensions | 253 × 178 × 13 mm · 294 g |
| Language | English |
