Povej prijatelju o tem izdelku:
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes Edmund G. Seebauer 2009 edition
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes
Edmund G. Seebauer
"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
298 pages, 30 black & white tables, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 1. decembra 2008 |
| ISBN13 | 9781848820586 |
| Založniki | Springer London Ltd |
| Strani | 298 |
| Dimenzije | 155 × 235 × 25 mm · 635 g |
| Jezik | Angleščina |
Več od istega **izdajatelja**
Ogled vseh Edmund G. Seebauer ( Na primer Paperback Book in Hardcover Book )