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Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes Edmund G. Seebauer Softcover reprint of hardcover 1st ed. 2009 edition
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes
Edmund G. Seebauer
"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
298 pages, 30 black & white tables, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 22. oktobra 2010 |
| ISBN13 | 9781849968201 |
| Založniki | Springer London Ltd |
| Strani | 298 |
| Dimenzije | 155 × 235 × 16 mm · 435 g |
| Jezik | Angleščina |
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