Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques - Sebastian Huhn - Knjige - Springer Nature Switzerland AG - 9783030692087 - 20. aprila 2021
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Sebastian Huhn
Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 2021 edition

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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

164 pages, 75 Tables, color; 25 Illustrations, color; 22 Illustrations, black and white; XXI, 164 p.

Medij Knjige     Hardcover Book   (Knjiga s trdim hrbtom in platnicami)
Izdano 20. aprila 2021
ISBN13 9783030692087
Založniki Springer Nature Switzerland AG
Strani 164
Dimenzije 150 × 220 × 20 mm   ·   439 g
Jezik Nemščina  

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