Povej prijatelju o tem izdelku:
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation Fangzhou Xia
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
Fangzhou Xia
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 7. februarja 2025 |
| ISBN13 | 9783031442353 |
| Založniki | Springer International Publishing AG |
| Strani | 366 |
| Dimenzije | 150 × 220 × 10 mm · 664 g |
| Jezik | Nemščina |
Več od istega **izdajatelja**
Ogled vseh Fangzhou Xia ( Na primer Hardcover Book in Paperback Book )