Povej prijatelju o tem izdelku:
Applied Scanning Probe Methods I - NanoScience and Technology B Bhushan 2004 edition
Applied Scanning Probe Methods I - NanoScience and Technology
B Bhushan
This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.
476 pages, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 13. januarja 2004 |
| ISBN13 | 9783540005278 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 476 |
| Dimenzije | 155 × 235 × 27 mm · 870 g |
| Jezik | Francoščina |
| Urednik | Bhushan, Bharat |
| Urednik | Fuchs, Harald |
| Urednik | Hosaka, Sumio |