Applied Scanning Probe Methods III: Characterization - NanoScience and Technology - Bharat Bhushan - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540269090 - February 22, 2006
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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology 2006 edition

Bharat Bhushan

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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology 2006 edition

There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.


378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 22, 2006
ISBN13 9783540269090
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 378
Dimensions 166 × 243 × 21 mm   ·   716 g
Language German  
Editor Bhushan, Bharat
Editor Fuchs, Harald

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