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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Bharat Bhushan 2006 edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
Bharat Bhushan
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 22. februarja 2006 |
| ISBN13 | 9783540269090 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 378 |
| Dimenzije | 166 × 243 × 21 mm · 716 g |
| Jezik | Nemščina |
| Urednik | Bhushan, Bharat |
| Urednik | Fuchs, Harald |