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Applied Scanning Probe Methods: Characterization - Nanoscience and Technology Donna R. Kemp 1st edition
Applied Scanning Probe Methods: Characterization - Nanoscience and Technology
Donna R. Kemp
Presents 10 chapters on a variety of techniques and refinements of Scanning Probe Methods (SPM) applications.
338 pages, 7 black & white tables, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 18. oktobra 2006 |
| ISBN13 | 9783540373186 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 338 |
| Dimenzije | 155 × 235 × 19 mm · 648 g |
| Jezik | Angleščina |
| Urednik | Bhushan, Bharat |
| Urednik | Fuchs, Harald |
| Urednik | Kawata, Satoshi |
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