Povej prijatelju o tem izdelku:
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 12. februarja 2010 |
| ISBN13 | 9783642065965 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 378 |
| Dimenzije | 155 × 235 × 21 mm · 639 g |
| Jezik | Nemščina |
| Urednik | Bhushan, Bharat |
| Urednik | Fuchs, Harald |