Povej prijatelju o tem izdelku:
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences Ludwig Reimer Softcover reprint of the original 2nd ed. 1998 edition
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences
Ludwig Reimer
The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
529 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 1. decembra 2010 |
| ISBN13 | 9783642083723 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 529 |
| Dimenzije | 241 × 161 × 33 mm · 771 g |
| Jezik | Angleščina |
| Sodelujoči | Peter W Hawkes |
Božična darila lahko vrnete do 31. januarja