Povej prijatelju o tem izdelku:
Thin Film and Depth Profile Analysis - Topics in Current Physics H Oechsner Softcover reprint of the original 1st ed. 1984 edition
Thin Film and Depth Profile Analysis - Topics in Current Physics
H Oechsner
With contributions by numerous experts
224 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 27. marca 2012 |
| ISBN13 | 9783642465017 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 208 |
| Dimenzije | 170 × 244 × 12 mm · 362 g |
| Jezik | Nemščina |
| Urednik | Oechsner, H. |